Analytical models of probability distribution and excess noise factor of Solid State Photomultiplier signals with crosstalk

摘要

Silicon Photomultipliers (SiPM), also so-called Solid State Photomultipliers(SSPM), are based on Geiger mode avalanche breakdown limited by strong negativefeedback. SSPM can detect and resolve single photons due to high gain andultra-low excess noise of avalanche multiplication in this mode. Crosstalk andafterpulsing processes associated with the high gain introduce specific excessnoise and deteriorate photon number resolution of the SSPM. Probabilisticfeatures of these processes are widely studied because of its high importancefor the SSPM design, characterization, optimization and application, but theprocess modeling is mostly based on Monte Carlo simulations and numericalmethods. In this study, crosstalk is considered to be a branching Poissonprocess, and analytical models of probability distribution and excess noisefactor (ENF) of SSPM signals based on the Borel distribution as an advance onthe geometric distribution models are presented and discussed. The models arefound to be in a good agreement with the experimental probability distributionsfor dark counts and a few photon spectrums in a wide range of fired pixelsnumber as well as with observed super-linear behavior of crosstalk ENF.